固态硬盘光威悍将240G，主控芯片为PS3111，莫名无法开机，随后用别的电脑查看无法格式化和无法显示盘符，但是能显示硬盘链接，随后研究了下用量产工具进行量产，卡在了一个检测环节，请帮忙看看如何解。
使用的是量产工具是SSD MP TOOL V2.2.22,如下为设置内部设置图片和报错情况，在最下面。
!img(https://img-mid.csdnimg.cn/release/static/image/mid/ask/923774138656199.png "left")
Day: ( 3 \ 7 \ 2022) Time: (14:46:26) TesterNumber:1
ConfigID
ID=98 3C 98 B3 76 72-BICS3
SN Set
SN_Set=0
SN_Type=255
SN_Len=12
SN_Start=000000000001
SN_End=999999999999
SN_Mask=
Other
SATA_SSC_Enable=1
StationName
01=EraseAll
02=RDT
03=RDTResult
04=MP
05=ReMP
06=ICT
07=UpdateFW
08=ScanBad
General Info
TestStationSel=3
TestStation=F1
WorkingNo=00000000
ModelName=SATA SSD
SerialNum=000000000001
MaxCurrent=400
Flash Info
Flh_Type=TLC_16K
Flh_MakeCode=Toshiba
Flh_ID=98 3c 98 b3 76 72
Flh_Capacity=262144
Flh_CapacitySel=21
Flh_Number=8
Flh_NumberSel=8
Flash Clock=200
Flash Interface=3
Device Info
SATASpeed=2
ControllerType=SSD-3111SB
ICFWVersion=SBFQ61L3
3111SBISP_CodeVersion=Q61L3
3111SBISP_MPBINCode=.\Bin\SBFQ61L3.BIN
3111SBISP_RDTBINCode=.\Bin\SBSC61.2.BIN
SSD Size=2.5"
Options
DDRSize=32
Set Firmware Name=SBFM51.2
Enable_Set_Custom_SMART_Temperature=1
Set_Custom_SMART_Temperature=33
Set_LBTOEB=10
Smart_Table=0
SLCPoolSizeSel=1
SLCPoolSize=0
Disable_DIPM_Support=1
Use Partial Size=1
DEVSLP_Enable=1
Put_Thermal_Sensor=0
Skip_Check_RDDebugPage=1
PretestType=1
PMASetting=42035
[InfoBlock]
Byte_290=E8
Byte_291=03
[EraseAll]
Do_Erase_First=1
Type=09
Log
Use Partial Size, 256 GB -> 240 GB.
Success Modify InfoBlock OK.
Info MP AP: V2.06_x02(China), MAC Address: , ISP FW: SBFQ61L3.BIN, Station:F1T
Success Check Device State OK.
Success Check IO State OK- Total take 15.281 sec.
Success Check ICVer. OK.
Success AES VUC Process OK.
Success ISP Program PRAM OK.
Success eFuse Info
UART : Enable
JTAG : Enable
Trim good die : 01
Get Controller ID : 2F_35_07_03_1C_1D_01
Trim good die : 01
Y Coordination : 2f
X Coordination : 35
Wafer ID : 07
Lot ID 4 : 03
Lot ID 3 : 1c
Lot ID 2 : 1d
Lot ID 1 : 01
CTL Version : 03
Success Check eFuse OK.
Success Verify param.ini with Device Info OK.
Scan_Flash_SDLL:
DiePerFlash=1, SectorPerPage=32
Ch=01, Bank=03
FlashMode : 3 FlashClock : 7 FlashODT : 0 Flash(NAND)Drive : 0 PadODTEnable : 0 PadODT : 0
PADDriveEnable : 0 ALEPads : 0 CLEPads : 0 WEPads : 0 REPads : 0 FRDYPads : 0
WPPads : 0 DQSPads : 0 DataPads : 0 CEPads : 0 ScanRound : 0 Scan Interval : 50
Scan_LDPC_Error_Bit : 0x03FF
BitMask : 0 SlewRateEnable : 0 SlewRate : 0 EnableOverClocking : 0
Set Scan Window Criteria : 50
Duty Range : 0~0
Duty : 0 Bank : 0 Die : 0
CH 0 Read-Min : 0 Read-Max : 135 Write-Min : 0 Write-Max : 137
CH 1 Read-Min : 0 Read-Max : 129 Write-Min : 0 Write-Max : 143
Duty : 0 Bank : 1 Die : 0
CH 0 Read-Min : 0 Read-Max : 137 Write-Min : 0 Write-Max : 138
CH 1 Read-Min : 0 Read-Max : 128 Write-Min : 0 Write-Max : 140
Duty : 0 Bank : 2 Die : 0
CH 0 Read-Min : 0 Read-Max : 135 Write-Min : 0 Write-Max : 137
CH 1 Read-Min : 0 Read-Max : 129 Write-Min : 0 Write-Max : 140
Duty : 0 Bank : 3 Die : 0
CH 0 Read-Min : 0 Read-Max : 133 Write-Min : 0 Write-Max : 137
CH 1 Read-Min : 0 Read-Max : 129 Write-Min : 0 Write-Max : 140
CH0 Read :
Duty_0: CH_0: Read_Min : 0 Read_Max : 133 (Range : 134)
CH1 Read :
Duty_0: CH_1: Read_Min : 0 Read_Max : 128 (Range : 129)
CH0 Write :
Duty_0: CH_0: Write_Min : 0 Write_Max : 137 (Range : 138)
CH1 Write :
Duty_0: CH_1: Write_Min : 0 Write_Max : 140 (Range : 141)
Find Read Max Duty :Ch_0 Duty_0 Ch_1 Duty_0
Windows:
Duty_0 CH_0: Read Window=0x42, Write Window=0x44
Duty_0 CH_0: HW_Rd=0x43, HW_Wr=0x44
ScanValueRe[0] = 0x8001 ScanValueWr[0] = 0x8000
Duty_0: Bank_0: Die_0: Read Win=0x43(Min=0x0, Max=0x87)
Write_Win=0x44(Min=0x0, Max=0x89)
Duty_0: Bank_1: Die_0: Read Win=0x44(Min=0x0, Max=0x89)
Write_Win=0x45(Min=0x0, Max=0x8a)
Duty_0: Bank_2: Die_0: Read Win=0x43(Min=0x0, Max=0x87)
Write_Win=0x44(Min=0x0, Max=0x89)
Duty_0: Bank_3: Die_0: Read Win=0x42(Min=0x0, Max=0x85)
Write_Win=0x44(Min=0x0, Max=0x89)
Duty_0 CH_1: Read Window=0x40, Write Window=0x46
Duty_0 CH_1: HW_Rd=0x43, HW_Wr=0x44
ScanValueRe[1] = 0x8003 ScanValueWr[1] = 0x2
Duty_0: Bank_0: Die_0: Read Win=0x40(Min=0x0, Max=0x81)
Write_Win=0x47(Min=0x0, Max=0x8f)
Duty_0: Bank_1: Die_0: Read Win=0x40(Min=0x0, Max=0x80)
Write_Win=0x46(Min=0x0, Max=0x8c)
Duty_0: Bank_2: Die_0: Read Win=0x40(Min=0x0, Max=0x81)
Write_Win=0x46(Min=0x0, Max=0x8c)
Duty_0: Bank_3: Die_0: Read Win=0x40(Min=0x0, Max=0x81)
Write_Win=0x46(Min=0x0, Max=0x8c)
Success Scan Window Process OK- Total take 3.391 sec.
Fail Error Message : Not Running on Flash Code now- SBRM02.0
Error Code : I_B67
AP Command : a1-8-e-0-1-0-0-0-e0-ec-0-0
OS LastError : 0
ATA Reg:000000
Error End Time: (14:46:47)
Success AES VUC Process OK.
Success ISP Program PRAM OK.
Do SDR Write/Read Test, SDR Size= 32 MB
Success DMA Write_Read SDR test ok, Total take 2.993 sec.
Success Set Erase Type : 09
Do EraseAll, Type=0x09
Success Full Erase All Block OK.
Start Scan Bad Block Progress ...
ScanBad: set_SSDSize= 468862128
Vender_MaxBad_PerPlane with LBA= 468862128
Die Size = 32 GB
(FW)Max_badblock_perplane = 152 (Setting)Max_badblock_perplane = 0
Get Max Bad block number per Plane= 152
FlashNumber=8, MaxBad_perPlane/Die=152
CENo_0/Die_0-> Early Bad Count: Plane0=1, Plane1=5
CENo_1/Die_0-> Early Bad Count: Plane0=4, Plane1=4
CENo_2/Die_0-> Early Bad Count: Plane0=10, Plane1=7
CENo_3/Die_0-> Early Bad Count: Plane0=34, Plane1=4
CENo_8/Die_0-> Early Bad Count: Plane0=6, Plane1=4
CENo_9/Die_0-> Early Bad Count: Plane0=14, Plane1=31
CENo_10/Die_0-> Early Bad Count: Plane0=4, Plane1=8
CENo_11/Die_0-> Early Bad Count: Plane0=14, Plane1=14
Success Scan Bad Process OK.
Use Partial Size, 256 GB -> 240 GB.
Set_Custom_SMART_Temperature : 33 (dec)
Success Modify InfoBlock OK.
Do PreFormat:
Smart_Table = 0
** Fail Error Message : Issue Card Detect command Fail(Tester)
Error Code : T_H07
AP Command : a1-1e-0-0-0-0-0-0-0-0-0-0
OS LastError : 0
ATA Reg:000000
Error End Time: (14:47:11) **
目前别的方法可以尝试了，不是太懂这个问题卡检测失败是因为设置还是硬件问题
希望解释下这个问题应该如何处理，可以让我继续量产下去，谢谢。
我可以帮你看看的